Electrical and Magnetic Properties of Ultrathin Polycrystalline Fe Films Grown on SiO 2 /Si(001)
Ultrathin polycrystalline Fe films have been grown on the oxidized surface of a Si(001) substrate. The resistivity and magnetic hysteresis of Fe films have been measured in the range of thickness from 2.5 to 10 nm. Based on the analysis of the data obtained, it is suggested that there is a transition to the structurally continuous film at a thickness of ~6 nm. It is found that Fe grains in this film acquire the preferred (111) orientation during this transition.
Publisher URL: https://link.springer.com/article/10.1134/S1063785018070040