3 years ago

Growth, characterization, and thin film transistor application of CH3NH3PbI3 perovskite on polymeric gate dielectric layers

Growth, characterization, and thin film transistor application of CH3NH3PbI3 perovskite on polymeric gate dielectric layers
Louis M. Leung, Johnny K. W. Ho, S. H. Cheung, S. K. So, Rocky K. H. Chan, Jenner H.[space]L. Ngai
Micron-size organolead perovskite crystals grown on insulating polymeric surfaces as gate dielectric materials for high performance thin film transistors.

Publisher URL: http://feeds.rsc.org/~r/rss/ra/~3/KLIGdLi96oA/C7RA08699G

DOI: 2017/RA/C7RA08699G

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