3 years ago

Optically Coupled Methods for Microwave Impedance Microscopy.

Scott R. Johnston, Eric Yue Ma, Zhi-Xun Shen

Scanning Microwave Impedance Microscopy (MIM) measurement of photoconductivity with 50 nm resolution is demonstrated using a modulated optical source. The use of a modulated source allows for measurement of photoconductivity in a single scan without a reference region on the sample, as well as removing most topographical artifacts and enhancing signal to noise as compared with unmodulated measurement. A broadband light source with tunable monochrometer is then used to measure energy resolved photoconductivity with the same methodology. Finally, a pulsed optical source is used to measure local photo-carrier lifetimes via MIM, using the same 50 nm resolution tip.

Publisher URL: http://arxiv.org/abs/1710.10239

DOI: arXiv:1710.10239v1

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