4 years ago

Microstructural characterization of Cr-doped (Bi,Sb)2Te3 thin films

Microstructural characterization of Cr-doped (Bi,Sb)2Te3 thin films
R. E. Dunin-Borkowski, C. Gould, G. Karczewski, M. Duchamp, L. W. Molenkamp, S. Schreyeck, N. V. Tarakina, K. Brunner
We describe defects present in Cr-doped (Bi,Sb)2Te3 thin films and suggest ways for controlling the structural quality of such films.

Publisher URL: http://feeds.rsc.org/~r/rss/CE/~3/UnRZliIkeus/C7CE00872D

DOI: 2017/CE/C7CE00872D

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