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4 years ago

Localized Defects on Copper Sulfide Surface for Enhanced Plasmon Resonance and Water Splitting

Localized Defects on Copper Sulfide Surface for Enhanced Plasmon Resonance and Water Splitting
Lan Cui, Yuzhu Zhou, Cunku Dong, Hui Liu, Kaixv Ren, Xingzhong Cao, Xiwen Du, Pengfei Yin
Surficial defects in semiconductor can induce high density of carriers and cause localized surface plasmon resonance which is prone to light harvesting and energy conversion, while internal defects may cause serious recombination of electrons and holes. Thus, it is significant to precisely control the distribution of defects, although there are few successful examples. Herein, an effective strategy to confine abundant defects within the surface layer of Cu1.94S nanoflake arrays (NFAs) is reported, leaving a perfect internal structure. The Cu1.94S NFAs are then applied in photoelectrochemical (PEC) water splitting. As expected, the surficial defects give rise to strong LSPR effect and quick charge separation near the surface; meanwhile, they provide active sites for catalyzing hydrogen evolution. As a result, the NFAs achieve the top PEC properties ever reported for CuxS-based photocathodes. CuxS nanoflake arrays (NFAs) with abundant surficial defects and a perfect internal structure are applied in photoelectrochemical (PEC) water splitting; the surficial defects give rise to strong localized surface plasmon resonance effect and quick charge separation near the surface. They also provide active sites for catalyzing hydrogen evolution. As a result, the NFAs achieve the top PEC properties ever reported for CuxS-based photocathodes.

Publisher URL: http://onlinelibrary.wiley.com/resolve/doi

DOI: 10.1002/smll.201700867

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