3 years ago

Measurement of thickness of thin film by fitting to the intensity profile of Fresnel diffraction from a nanophase step

Ali Motazedifard, S. Dehbod, A. Salehpour
Diffraction of light beams from the phase steps due to abrupt/sharp changes in the boundary of the steps leads to Fresnel fringes whose visibility and intensity profile depend on the change of the step height or light incident angle. The visibility has been utilized in measurements of different ...

Publisher URL: http://www.osapublishing.org/abstract.cfm

DOI: josaa-35-12-2010

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