Advanced Materials
Advanced Materials
5 years ago

Imaging Nanoscale Morphology of Semiconducting Polymer Films with Photoemission Electron Microscopy

Imaging Nanoscale Morphology of Semiconducting Polymer Films with Photoemission Electron Microscopy
Falk Niefind, Andreas Neff, Bernd Abel, Katrin R. Siefermann, Stefan C. B. Mannsfeld
Photoemission electron microscopy in combination with polarized laser light is presented as a tool permitting direct imaging of polymer-chain orientation and local degree of order in semicrystalline samples of semiconducting polymers, a promising class of materials for future electronics. The key advantages of this imaging tool are its nondestructive and fast measurements, straightforward data analysis, the low complexity of sample preparation, and the possibility of performing measurements on a broad variety of technologically relevant substrates. The high spatial resolution of the microscope provides insights into the nanoscale morphology, which is relevant for the material's performance in electronic devices. Photoemission electron microscopy in combination with polarized laser light is presented as a tool permitting fast imaging of polymer-chain orientation and local degree of order in semicrystalline samples of semiconducting polymers. The high spatial resolution of the microscope provides insights into the nanoscale morphology, which is relevant for the material's performance in electronic devices.

Publisher URL: http://onlinelibrary.wiley.com/resolve/doi

DOI: 10.1002/adma.201701012

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