Direct S-matrix calculation for diffractive structures and metasurfaces.
The paper presents a derivation of analytical components of S-matrices for arbitrary planar diffractive structures in the Fourier domain. Attained general formulas for S-matrix components can be applied within both formulations in the Cartesian and curvilinear metric. A numerical method based on these results can benefit from all previous improvements of the Fourier domain methods. In addition, we provide expressions for S-matrix calculation in case of periodically corrugated layers of 2D materials, which are valid for arbitrary corrugation depth-to-period ratios. Obtained S-matrices are used to simulate resonant grating excitation of graphene plasmons and an impact of silica interlayer on corresponding reflection curves.
Publisher URL: http://arxiv.org/abs/1712.08361