3 years ago

Nucleation and growth of H blisters in stacking fault on B2-FeAl {100} planes

Nucleation and growth of H blisters in stacking fault on B2-FeAl {100} planes
Meijuan Hu, Tao Tang, Guikai Zhang, Lang Liu, Zhaoyi Luo, Feilong Yang
The stacking fault (SF) on B2-FeAl {100} planes serve as trapping center to attract the H atoms nearby, being the nucleation site for H blisters.

Publisher URL: http://feeds.rsc.org/~r/rss/ra/~3/kPPBuaV_j3I/C7RA08368H

DOI: 2017/RA/C7RA08368H

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