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Optical and Optoelectronic Property Analysis of Nanomaterials inside Transmission Electron Microscope

Optical and Optoelectronic Property Analysis of Nanomaterials inside Transmission Electron Microscope
Joseph F. S. Fernando, Konstantin L. Firestein, Dmitri Golberg, Chao Zhang
In situ transmission electron microscopy (TEM) allows one to investigate nanostructures at high spatial resolution in response to external stimuli, such as heat, electrical current, mechanical force and light. This review exclusively focuses on the optical, optoelectronic and photocatalytic studies inside TEM. With the development of TEMs and specialized TEM holders that include in situ illumination and light collection optics, it is possible to perform optical spectroscopies and diverse optoelectronic experiments inside TEM with simultaneous high resolution imaging of nanostructures. Optical TEM holders combining the capability of a scanning tunneling microscopy probe have enabled nanomaterial bending/stretching and electrical measurements in tandem with illumination. Hence, deep insights into the optoelectronic property versus true structure and its dynamics could be established at the nanometer-range precision thus evaluating the suitability of a nanostructure for advanced light driven technologies. This report highlights systems for in situ illumination of TEM samples and recent research work based on the relevant methods, including nanomaterial cathodoluminescence, photoluminescence, photocatalysis, photodeposition, photoconductivity and piezophototronics. Optical, optoelectronic and photocatalytic experiments in a transmission electron microscope (TEM) are presented. With the recent development of TEMs and specialized TEM holders that include in situ illumination and light collection optics, it is possible to perform diverse experiments on nanostructures with simultaneous high resolution imaging, thus deep insights into the physical property versus true structure and its dynamics could be established.

Publisher URL: http://onlinelibrary.wiley.com/resolve/doi

DOI: 10.1002/smll.201701564

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