4 years ago

Direct Visualization of Local Electromagnetic Field Structures by Scanning Transmission Electron Microscopy

Direct Visualization of Local Electromagnetic Field Structures by Scanning Transmission Electron Microscopy
Takao Matsumoto, Yuji Kohno, Scott D. Findlay, Yuichi Ikuhara, Gabriel Sánchez-Santolino, Takehito Seki, Naoya Shibata
The functional properties of materials and devices are critically determined by the electromagnetic field structures formed inside them, especially at nanointerface and surface regions, because such structures are strongly associated with the dynamics of electrons, holes and ions. To understand the fundamental origin of many exotic properties in modern materials and devices, it is essential to directly characterize local electromagnetic field structures at such defect regions, even down to atomic dimensions. In recent years, rapid progress in the development of high-speed area detectors for aberration-corrected scanning transmission electron microscopy (STEM) with sub-angstrom spatial resolution has opened new possibilities to directly image such electromagnetic field structures at very high-resolution.

Publisher URL: http://dx.doi.org/10.1021/acs.accounts.7b00123

DOI: 10.1021/acs.accounts.7b00123

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